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https://hdl.handle.net/1889/3590
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DC Field | Value | Language |
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dc.contributor.advisor | Cova, Paolo | - |
dc.contributor.author | Chiozzi, Diego | - |
dc.date.accessioned | 2018-05-07T11:01:34Z | - |
dc.date.available | 2018-05-07T11:01:34Z | - |
dc.date.issued | 2018-03 | - |
dc.identifier.uri | http://hdl.handle.net/1889/3590 | - |
dc.description.abstract | In this work, an overview on the importance of reliability and its main methodologies will be provided in order to model and to simulate complex power electronic systems, while in the second part new methodologies of modeling will be presented with the purpose of reducing simulation time without losing quality of the results. In particular, the methods developed could be considered lightweight methods by using standard model techniques, with the advantage to save time but with the ability to reproduce, completely or partially the electro-thermal behavior of power electronic devices. The dissertation presents three new modeling methodologies. The first one merges the advantages of finite element modeling with lumped element modeling in order to simplify non-stationary finite element studies. The second one explains a new methodology able to describe the non-linear thermal behavior of a complex electronics system through the use of a lumped element model. The methodology proposed was applied on a system with multiple heat sources. The last one is dedicated to electro-thermal modeling. The developed methodology allows to describe the entire electrical and thermal behavior of a complex power system through the use of a SPICE simulator. The model created through these techniques is fast and the advantages for the designer are great; in fact, with only one tool a system could be modeled and simulated. | it |
dc.language.iso | Inglese | it |
dc.publisher | Università di Parma. Dipartimento di Ingegneria e Architettura | it |
dc.relation.ispartofseries | Dottorato di ricerca in Tecnologie dell'informazione | it |
dc.rights | © Diego Chiozzi, 2018 | it |
dc.subject | Lumped Element Model | it |
dc.subject | Finite Element Method | it |
dc.subject | Alternative Methodology | it |
dc.subject | Thermal Behavior | it |
dc.subject | Electrical Behavior | it |
dc.subject | Semiconductor Device Electro-Thermal Modeling | it |
dc.subject | Power MOSFET | it |
dc.subject | Automotive power electronic systems | it |
dc.title | Electro-thermal simulation methodologies for automotive power electronic systems | it |
dc.type | Doctoral thesis | it |
dc.subject.miur | ING-INF/01 | it |
Appears in Collections: | Tecnologie dell'informazione. Tesi di dottorato |
Files in This Item:
File | Description | Size | Format | |
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Diego_Chiozzi_Relazione_Finale.pdf Until 2100-01-01 | Relazione Finale | 132.57 kB | Adobe PDF | View/Open Request a copy |
Diego_Chiozzi_Tesi_Dottorato_di_Ricerca.pdf | Tesi di Dottorato | 7.45 MB | Adobe PDF | View/Open |
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