Please use this identifier to cite or link to this item: https://hdl.handle.net/1889/4291
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dc.contributor.advisorZappettini, Andrea-
dc.contributor.authorSarzi Amadè, Nicola-
dc.date.accessioned2021-04-22T13:23:31Z-
dc.date.available2021-04-22T13:23:31Z-
dc.date.issued2021-04-
dc.identifier.urihttps://hdl.handle.net/1889/4291-
dc.description.abstractRoom Temperature Semiconductor Detectors based on CdZnTe have been widely used in X- and γ-ray spectroscopy in the energy range 10–10000 keV owing to their compactness, high energy resolution and high stopping power. These detectors do not require any cooling which enables their applicability in various fields such as medical imaging, environmental monitoring, astrophysics, decommissioning, nuclear power plants monitoring and homeland security. The related advancements in material science (crystal growth and processing, contact deposition) and technology (low-noise pre-amplifier, signal processing) are undoubtedly consolidated. Nonetheless, the measurements obtained with such devices are still affected by spectral distortions, which are mainly related to partial transfer of the photon energy, incomplete charge collection and excessive noise. Therefore, a straightforward interpretation of experimental data is not always possible. The development of powerful data analysis methods has always accompanied experimental science, and hence also this sector. Nowadays, the extensive knowledge of the physical mechanisms underlying the functioning of CdZnTe- based detectors can be combined with the tremendous progresses of the last decade in data science to push further the performances of these devices. This thesis is focused on the development of algorithms and techniques to correct spectral distortions affecting CdZnTe-based devices and to extract reliable information from measurements.en_US
dc.language.isoIngleseen_US
dc.publisherUniversità degli Studi di Parma. Dipartimento di Scienze chimiche della vita e della sostenibilità ambientaleen_US
dc.publisherConsiglio Nazionale delle Ricerche. Istituto dei Materiali per l’Elettronica e il Magnetismoen_US
dc.relation.ispartofseriesDottorato di ricerca in Scienza e tecnologia dei materialien_US
dc.rights© Nicola Sarzi Amadè, 2021en_US
dc.rightsAttribuzione - Non commerciale - Non opere derivate 3.0 Italiaen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/it/*
dc.subjectGamma detectoren_US
dc.subjectCadmium zinc tellurideen_US
dc.subjectRoom temperature semiconductor detectoren_US
dc.subjectMachine learningen_US
dc.titleCorrection of X- and γ-ray spectra acquired by CZT-based detectorsen_US
dc.typeDoctoral thesisen_US
dc.subject.miurFIS/03en_US
Appears in Collections:Scienza e tecnologia dei materiali, Tesi di dottorato

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